最新咨询与活动

• 新闻稿
• 活动

新闻稿

Read the latest announcements from Veeco corporate, metrology and instrumentation, process equipment, and epitaxial equipment. 

• February 21, 2008
  Veeco TurboDisc K465 GaN MOCVD Tool Accepted by Leading Japanese Device Manufacturer
• February 14, 2008
  Veeco Upcoming Investor Events
• February 11, 2008
  Veeco Announces Fourth Quarter and 2007 Financial Results
• January 28, 2008
  Veeco Appoints Mark Munch EVP, GM, Metrology and Instrumentation
• 新闻稿 存档

• 测量设备
  • January 3, 2008
    Veeco BioScope II Selected By M.E. Muller Institute for Structural Biology
  • December 4, 2007
    Veeco Introduces New InSight 3D Atomic Force Microscope
  • November 26, 2007
    Veeco Introduces Wyko NT9100 Table-Top Optical Profiler
  • August 21, 2007
    Veeco Releases Next-Generation Optical Metrology System for Semiconductor Packaging Inspection
  • June 15, 2007
    推出新产品INNOVA 显微镜
  • 测量设备 存档
• 工艺设备
  • November 1, 2007
    Veeco MOCVD Tools Selected for ROY HB-LED Capacity Expansion at Xiamen Sanan OptoElectronics in China
  • July 27, 2007
    Veeco Receives Orders for Multiple New ALD Systems for Next Generation Thin Film Magnetic Heads
  • April 24, 2007
    Veeco Receives First Order for New High-Rate PVD System for Next Generation Aluminum Oxide Deposition
  • April 23, 2007
    Veeco Selected by SEMATECH for $2.4 Million EUV Lithography Tool Development Project
  • February 1, 2007
    Veeco Receives Order for PVD System for Advanced Sensor Development
  • 工艺设备 存档
• 外延设备
  • February 21, 2008
    Veeco TurboDisc K465 GaN MOCVD Tool Accepted by Leading Japanese Device Manufacturer
  • October 24, 2007
    Veeco Receives Orders For Five MBE Systems
  • October 9, 2007
    Veeco Introduces TurboDisc E475 MOCVD System for R/O/Y HB-LED and Solar Applications
  • August 23, 2007
    Veeco Introduces PV-Series Thermal Deposition Sources for CIGS Thin Film Solar Manufacturing
  • May 4, 2007
    即将在5月15日主办VEECO MOCVD 研讨会
  • 外延设备 存档